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11). Since power dissipation is dependent on switching activity of the active elements during each test session‚ the variation in power dissipation is also due to useless power dissipation defined in Chapter 6. 13 shows the three dimensional testable design space for the 32 point discrete cosine transform data path. 13). The aim of the techniques proposed in Chapter 6 is to efficiently explore the three dimensional design space and eliminate useless power dissipation without any effect on test application time or BIST area overhead.

ITRS [70] also anticipates that test power management will lower the manufacturing test cost by enabling test cell throughput enhancements in the near-term. Furthermore‚ in the long-term‚ decreasing the die thermal density is a major challenge for wafer probe and component test‚ whose solution will also lower the cost of the DUT to ATE interface. 1 Introduction This chapter gives a review of the recently proposed solutions for dealing with power dissipation during test application. 2 gives a taxonomy of the existing approaches which handle test power.

The technique is test set dependent which means that power minimization depends on the size and the value of the test vectors in the test set. Due to its test set dependence, the technique proposed in [33] is computationally infeasible due to large computation time required to explore the large design space. A different approach to achieve power savings is the use of extra primary input vectors, which leads to supplementary volume of test data [62, 64, 136]. 8. While shifting out the pseudo output part of the test response during the clock cycles the value of the primary inputs is redundant.

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